The 15th European Microscopy Congress
Manchester Central, United Kingdom
was held on 16th -
© Royal Microscopical Society 2012
emc2012 was organised by
the Royal Microscopical
Society
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PS2.3: In Situ and Environmental EM
Session co-organisers: Eva Olsson, Thomas Willum Hansen, Suzanne Giorgio
In situ and environmental electron microscopy enables the direct correlation between microstructure and materials properties. Investigations can be carried out at different length scales, ranging from the micro- to the atomic scale. Correlative microscopy, where different analysis techniques are combined to extend both length and time scales, further expands the information volume that can be extracted. This session addresses both in situ and environmental studies and the associated method and technique developments that open new possibilities for both fundamental understanding of materials, design of new materials with tailored properties and new applications. Various aspects of heating, cooling, gas treatments, electron beam induced deposition, sculpting and characterization of properties etc. within the microscope will be covered.
Peter Crozier (Invited) Arizona State University, USA
10:30 Dynamic study of carbon nanotube growth and catalyst morphology evolution during acetylene decomposition on Co/SBA-15 in an environmental TEM
Aires (Contributed) IRCELYON (UMR5256 CNRS/Univ. Lyon1)
10:45 In-situ TEM on (de)hydrogenation and oxidation/reduction of Pd
Zandbergen (Contributed) Kavli Institute of NanoScience, HREM, Delft University of Technology, The Netherlands
11:00 Nickel oxide reduction studied by environmental TEM and in situ XRD
Jeangros (Contributed) CIME, EPFL, Switzerland
11:15 Direct observation of electron beam induced silver nanocrystal growth by in situ liquid STEM
Woehl (Contributed) University of California, Davis, CA, USA
11:30 In-situ probing of crystal growth on the nano-scale
Stephan Hofmann (Invited) University of Cambridge, UK
Monday 17th September PM
14:00 Towards the quantitative analysis of the electron holographic phase images of electrically biased metal tips
Beleggia (Contributed) Technical University of Denmark
14:15 Electric field holder and special sample geometry for electron holographic investigation of materials response to electric biasing
Lenk (Contributed) Technische Universität Dresden Triebenberglabor, Germany
14:30 In situ light spectroscopy in the environmental transmission electron microscope (ETEM)
Cavalca (Contributed) Technical University of Denmark, Center for Electron Nanoscopy, Denmark
14:45 A bionanoreactor for in-situ correlative microscopy
Liv (Contributed) Delft University of Technology, The Netherlands
15:00 Dynamic exsolution of titanomagnetites and their associated magnetic response examined by complementary environmental TEM and off-axis electron holography
Almeida (Contributed) Department of Earth Science and Engineering, Imperial College London
15:15 In-situ reduction of Pt and Co3O4 nanoparticles
Ward (Contributed) University of York, UK
15:30 In-situ Transmission Electron Microscopy at pressures 1-5 bar and elevated temperatures
Henny Zandbergen (Invited) TU Delft, Netherlands
10:00 In-situ observation of graphene growth and dynamics of metallic systems by environmental scanning electron microscopy
Willinger (Contributed) Fritz Haber Institute of the Max Planck Society, Germany
10:15 In situ investigation of influence of the Pt nanobridges geometry on the area of grain formation
Kozlova (Contributed) Kavli Institute of Nanoscience, Delft University of Technology, The Netherlands
10:30 Cold field emission properties of a carbon cone nanotip studied by modeling and in situ electron holography
de Knoop (Contributed) CEMES-CNRS, France
10:45 Understanding abnormal grain growth in nanograined nickel through the combination of in situ TEM and precession microscopy
Khalid Hattar (Invited) Sandia National Laboratories, USA
11:15 In-situ HRTEM Electrical Experiments on Graphene at High Temperatures
Westenfelder (Contributed) Institute of Optoelectronics, Ulm University, Germany
11:30 Electrical and magnetoresistance properties of individual NiFe/Pt multilayer nanowires measured in situ in a scanning electron microscope
Elawayeb (Contributed) University of Sheffield, UK
11:45 Studies on localized corrosion in aluminium alloys using in situ transmission electron microscopy
Malladi (Contributed) Materials innovation institute, The Netherlands