The 15th European Microscopy Congress

Manchester Central, United Kingdom

was held on 16th - 21st September 2012

The European Microscopy Society presents

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PS2.7: Advances in spectroscopy in STEM and CTEM
Session co-organisers: Alan Craven, Servet Turan, Peter Schattschneider
Spectroscopy in the STEM and CTEM is a rapidly advancing field, based on new instrumentation, new techniques and new understanding. Monochromation, better energy filters, fast shutters and improved read-out, combined with progress in simulation, give access to information in EELS with unprecedented accuracy. Chiral techniques and cathodoluminescence are also developing rapidly.   Highly efficient detectors are creating renewed interest in EDX. Used either alone or in combination, these techniques give more complete information about materials than ever before.   This session aims to demonstrate such developments and their impact on the field.

Monday 17th September AM
10:00 Applications of electron energy loss spectroscopy with high spatial resolution and high energy resolution

Gianluigi Botton (Invited) McMaster University, Canada
10:30 The usage of density functional theory modelling to aid in the characterisation of single and double-layer hexagonal boron nitride
C Seabourne (Contributed) University of Leeds, UK
10:45 Site-specific electronic structure analysis by high angular resolution EELS using electron standing wave
K Tatsumi (Contributed) Nagoya University, Japan
11:00 Oxidation State Mapping: from bulk to the atomic scale
Haiyan Tan (Contributed) EMAT, University of Antwerp, Belgium

11:15 Vortex electrons as a probe for novel spectroscopic information at the atomic scale

Jo Verbeeck (Invited) University of Antwerp, Belgium

11:45 Theory of electron vortex-beam interaction with atoms

Jun Yuan (Contributed) University of York, UK

Monday 17th September PM
14:00 Atomic-resolution elemental mapping using energy-dispersive x-ray (EDX) spectroscopy
Les Allen (Invited) University of Melbourne, Australia
14:30 Identification of single atoms using energy-dispersive X-ray spectroscopy
Quentin Ramasse (Contributed) SuperSTEM Laboratory, UK
14:45 Synergies between EDX and EELS Chemical Analysis on a Probe Corrected STEM
Gerald Kothleitner (Contributed) Graz University of Technology, Austria
15:00 Quantitative core-loss EELS at the atomic scale

Christian Dwyer (Contributed) Monash Univeristy, Australia

15:15 Nanooptics with fast electrons: beyond simple cases?

Mathieu Kociak (Invited) Université Paris Sud, France
15:45 Extending the nanoscale imaging of plasmonic modes into the mid-infrared regime
D Rossouw (Contributed) McMaster University, Canada
16:00 Mapping substrate-induced hybridised surface plasmon resonances of a silver nanocube using machine learning methods
F de la Peña (Contributed) University of Cambridge, UK