The 15th European Microscopy Congress

Manchester Central, United Kingdom

was held on 16th - 21st September 2012

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Aberration Corrected TEM and Exit Wave Reconstruction

In this workshop we will discuss TEM image formation under aberration corrected conditions and the process of exit wave reconstruction.


The workshop will initially examine the essential electron optics relevant to hexapole aberration correctors used in TEM. Subsequently, the wave aberration function will be introduced together with experimental methods available for the measurement of individual aberration coefficients.


Subsequently, the basic principles of exit wave restoration will be examined and a practical demonstration using the FTSR software available from HREM research will be shown.