The 15th European Microscopy Congress

Manchester Central, United Kingdom

was held on 16th - 21st September 2012

The European Microscopy Society presents

Terms and conditions

Privacy Policy

© Royal Microscopical Society 2012

emc2012 was organised by

the Royal Microscopical


website by cooperrepco

Return to previous page Return to previous page Scientific Programme Contact us Proceedings Photographs
Company workshops
Thursday 20th September 2012

Workshop stand 1

Workshop stand 2

Workshop stand 3

Charter room 3


HREM Research, Inc. - Geometrical Phase Analysis (GPA)/Dark-Field Holography (HoloDark)

Visitron Systems - VisiScope Confocal based on NEW Spinning Disk CSU-W1 Generation  for Live Cell Imaging

Conference sessions


Leica - New Leica TCS SP8 - Looking forward to your discoveries

EDAX - The application of EBSD to routine material characterisation

Conference sessions


Leica - Amplify the power of imaging

FEI Company -Techniques for Nanoscale Materials Development

Thermo Scientific (PS1.1) - Full Chemical Characterization for Surfaces and Microstructures with XPS and Microanalysis

Gatan - Simplifying 3D EM with Serial Block Face Scanning Electron Microscopy


Carl Zeiss - Getting more with less Light - The new LSM 780 - Spectral GaAsP Array Detector - Improved Sensitivity for Fluorescence Detection  

Carl Zeiss - Nanofabrication at the sub 10nm lenghtscale using Helium ions

Carl Zeiss - A Step Change in Modern Microscopy - Axio Zoom .v16 a modern tool for life and physical sciences

Hitachi (PS2.2) - Enhanced SEM sample preparation with the Hitachi IM4000 Hybrid Ar+ ion mill


Indigo Scientific - Hyperspectr al and digital imaging new from Indigo Scientific

Lambda Photometrics Ltd -  Phenom ProX Desktop SEM Imaging & X-ray Analysis System

Hitachi - Optimise your microscopy with a new-generation sample cleaner: ZoneCleaner

Conference sessions


Olympus - Dedicated Objectives – Expert Optics for Expert Users

Conference sessions


Delmic (LS2.3 & LS2.7) - Intergrated Correlative Light and Electron Microscopy

Fischione & Oxford Instruments - Advances in surface-sensitive sample preparation using an adjustable broad beam ion source for SEM and EBSD

Conference sessions