Workshop stand 1

Workshop stand 2

Workshop stand 3

Charter room 3

11.00-11.45

HREM Research, Inc. - Geometrical Phase Analysis (GPA)/Dark-Field Holography (HoloDark)

Visitron Systems - VisiScope Confocal based on NEW Spinning Disk CSU-W1 Generation  for Live Cell Imaging

Conference sessions

11.45-12.30

Leica - New Leica TCS SP8 - Looking forward to your discoveries

EDAX - The application of EBSD to routine material characterisation

Conference sessions

12.30-13.15

Leica - Amplify the power of imaging

FEI Company -Techniques for Nanoscale Materials Development

Thermo Scientific (PS1.1) - Full Chemical Characterization for Surfaces and Microstructures with XPS and Microanalysis

Gatan - Simplifying 3D EM with Serial Block Face Scanning Electron Microscopy

13.15-14.00

Carl Zeiss - Getting more with less Light - The new LSM 780 - Spectral GaAsP Array Detector - Improved Sensitivity for Fluorescence Detection  

Carl Zeiss - Nanofabrication at the sub 10nm lenghtscale using Helium ions

Carl Zeiss - A Step Change in Modern Microscopy - Axio Zoom .v16 a modern tool for life and physical sciences

Hitachi (PS2.2) - Enhanced SEM sample preparation with the Hitachi IM4000 Hybrid Ar+ ion mill

14.00-14.45

Indigo Scientific - Hyperspectr al and digital imaging new from Indigo Scientific

Lambda Photometrics Ltd -  Phenom ProX Desktop SEM Imaging & X-ray Analysis System

Hitachi - Optimise your microscopy with a new-generation sample cleaner: ZoneCleaner

Conference sessions

14.45-15.30

Olympus - Dedicated Objectives – Expert Optics for Expert Users

Conference sessions

15.30-16.15

Delmic (LS2.3 & LS2.7) - Intergrated Correlative Light and Electron Microscopy

Fischione & Oxford Instruments - Advances in surface-sensitive sample preparation using an adjustable broad beam ion source for SEM and EBSD

Conference sessions